​We report on the synthesis and characterization of Cu₂ZnSnS₄ (CZTS) thin films prepared at different annealing temperatures using the sol-gel method and deposited on glass substrates using the immersing method. The XRD analysis demonstrates that the films annealed at 450 °C exhibit the most stable tetrahedral kesterite structure. Computationally, the Vienna ab initio simulation package (VASP) has been implemented to calculate critical structural properties of as-prepared CZTS) thin films and compared with those extracted from the XRD patterns. An excellent agreement is obtained between the calculated and measured structural parameters. Optical measurement of key optical parameters of annealed CZTS thin films shows a drastic manipulation of all-optical properties compared to the as-prepared thin films. In particular, an optical band gap of 1.62 eV obtained for annealed CZTS thin films at 450 °C makes …​